120 research outputs found
Ultrafast photocurrents at the surface of the three-dimensional topological insulator
Topological insulators constitute a new and fascinating class of matter with
insulating bulk yet metallic surfaces that host highly mobile charge carriers
with spin-momentum locking. Remarkably, the direction and magnitude of surface
currents can be controlled with tailored light beams, but the underlying
mechanisms are not yet well understood. To directly resolve the "birth" of such
photocurrents we need to boost the time resolution to the scale of elementary
scattering events ( 10 fs). Here, we excite and measure photocurrents in
the three-dimensional model topological insulator
with a time resolution as short as 20 fs by sampling the concomitantly emitted
broadband THz electromagnetic field from 1 to 40 THz. Remarkably, the ultrafast
surface current response is dominated by a charge transfer along the Se-Bi
bonds. In contrast, photon-helicity-dependent photocurrents are found to have
orders of magnitude smaller magnitude than expected from generation scenarios
based on asymmetric depopulation of the Dirac cone. Our findings are also of
direct relevance for optoelectronic devices based on topological-insulator
surface currents
Thickness dependence of electron-electron interactions in topological p-n junctions
Electron-electron interactions in topological p-n junctions consisting of
vertically stacked topological insulators are investigated. n-type Bi2Te3 and
p-type Sb2Te3 of varying relative thicknesses are deposited using molecular
beam epitaxy and their electronic properties measured using low-temperature
transport. The screening factor is observed to decrease with increasing sample
thickness, a finding which is corroborated by semi-classical Boltzmann theory.
The number of two-dimensional states determined from electron-electron
interactions is larger compared to the number obtained from
weak-antilocalization, in line with earlier experiments using single layers.Comment: 38 pages, 5 figures, 1 tabl
Electrical resistance of individual defects at a topological insulator surface
Three-dimensional topological insulators host surface states with linear
dispersion, which manifest as a Dirac cone. Nanoscale transport measurements
provide direct access to the transport properties of the Dirac cone in real
space and allow the detailed investigation of charge carrier scattering. Here,
we use scanning tunnelling potentiometry to analyse the resistance of different
kinds of defects at the surface of a (Bi0.53Sb0.47)2Te3 topological insulator
thin film. The largest localized voltage drop we find to be located at domain
boundaries in the topological insulator film, with a resistivity about four
times higher than that of a step edge. Furthermore, we resolve resistivity
dipoles located around nanoscale voids in the sample surface. The influence of
such defects on the resistance of the topological surface state is analysed by
means of a resistor network model. The effect resulting from the voids is found
to be small compared to the other defects
Capacitance‐Voltage Measurements of (Bi1‐xSbx)2Te3 Field Effect Devices
Capacitance-voltage (C-V) traces in n-type-(Bi1-xSbx)(2)Te-3/oxide/metal capacitor structures using an AC capacitance bridge are investigated. By tuning the top gate voltage (V-tg) from positive to negative values, the system at the interface is tuned from accumulation, via depletion into inversion. The results show the typical low-frequency and high frequency C-V traces, depending on measuring frequency, temperature, and illumination intensity and reflecting their sensitive dependence on recombination/generation rates. Superimposed a strong hysteresis under inversion is also observed which is ascribed to the presence of conventional localized surface states (LSS) which coexist with topological surface states (TSS)
Lifting the spin-momentum locking in ultra-thin topological insulator films
Three-dimensional (3D) topological insulators (TIs) are known to carry 2D
Dirac-like topological surface states in which spin-momentum locking prohibits
backscattering. When thinned down to a few nanometers, the hybridization
between the topological surface states at the top and bottom surfaces results
in a topological quantum phase transition, which can lead to the emergence of a
quantum spin Hall phase. Here, we study the thickness-dependent transport
properties across the quantum phase transition on the example of
(BiSb)Te films, with a four-tip scanning tunnelling
microscope. Our findings reveal an exponential drop of the conductivity below
the critical thickness. The steepness of this drop indicates the presence of
spin-conserving backscattering between the top and bottom surface states,
effectively lifting the spin-momentum locking and resulting in the opening of a
gap at the Dirac point. Our experiments provide crucial steps towards the
detection of quantum spin Hall states in transport measurements
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